Incize is responsible for delivering DC transistor characterization data in Cryo configuration (4K) to support the modeling effort on transistor from 22FDX SOI technology.

Also, INCIZE will develop their cryogenic measurement capability in substrate characterization based on RF measurement of transmission lines. The results will be obtained, supporting the characterization of Okmetic substrates.

Based on availability of suitable test structure, similar analysis will be performed on 22FDX SOI substrate.

Incize will take care of  cryogenic measurement base on the available samples, and the substrate analysis by means of RF transmission line analysis.

More information on www.incize.com